QA Technology is globally recognized for exceptional product performance, competitive prices, fast delivery and outstanding service.
Our spring loaded test probes and hyperboloid contacts are trusted and specified by the world’s most recognized technology companies and PCB test fixture manufacturers. Our customers know they will produce a higher quality product, meet delivery demands, and achieve higher production yields.
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IN-CIRCUIT/FUNCTIONAL (ICT/FCT) TEST PROBES
For in-circuit or functional testing of loaded or bare printed circuit boards.
For higher circuit density; larger probes mounted on closer centers
High conductivity, proprietary metals to carry increased electrical currents.
For use as electromechanical contact between fixture and tester.
DOUBLE ENDED PROBES
For use in testing semiconductor components, such as integrated circuits (IC) and ball grid arrays (BGA).
QA Technology’s high-performance hyperboloid contacts provide a robust and flexible connector system with the flexibility to accommodate standard and custom applications.
QA Introduces New K9 Serrated Tip Style Probes
QA Technology has expanded its 100-25 and X75-25 series to include a large serrated tip style. This new serrated tip provides a better fit and a more effective solution for:
New 47 Torch Tip Style For Long Stroke Probes
An aggressive steel tip style for contacting solder domes, QA’s 47 torch tip style is now available in our 0.400 [10.16] long stroke 100-40 and X75-40 probe series.
New Large Chisel
Tip Style Probes
QA Technology has expanded its tip style selection to include two new larger BeCu chisel tip styles for contact with larger plated through holes.
New 55 Crown Tip Style For Long Stroke Probes
To capture smaller leads and posts in dual level testing, QA’s self-cleaning 55 steel crown tip style is now available in our 0.400 [10.16] long stroke 075-40 and X50-40 probe series.
