| 1984 |
- Introduction of the industry’s first Computer Controlled Life Cycle Tester
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| 1985 |
- Introduction of the 0.050 inch centers, 0.160 inch stroke (050-16 series) test probes, sockets and wire plugs
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| 1986 |
- Open House at our new manufacturing facility at 4 Merrill Industrial Drive in Hampton, New Hampshire
- U.S. patent #4,597,622 is granted for WP30 and WP28 wire plug and plug housing
- Probe marking system is introduced for visual designation of spring force and tube materials/finishes
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| 1987 |
- U.S. Patent #4,659,987 is granted for 050-16 Series test probes and connectors
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| 1988 |
- Introduction of the more accurate double press ring socket design for the 050-16 Series
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| 1989 |
- The rolled tube design 100-25, 100-40 and 075-25 Series test probes are introduced
- U.S. Patent #4,885,533 is granted for the rolled tube designs
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| 1993 |
- Building expanded an additional 20,000 square feet, bringing QA’s headquarters to a total of 35,000 square feet
- Introduction of the industry’s first triple press ring socket for the 050-25 Series.
- Introduction of an automatic socket assembly machine creating leaktight receptacles, hermetically soldering the wire wrap pin into the socket
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| 1996 |
- U.S. Patent #5,524,466 is granted for the triple press ring socket
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| 1998 |
- Awarded ISO9001 Certification
- Introduction of the 0.039 inch centers, 0.160 inch stroke (039-16 Series) test probes, sockets and wire jacks
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| 1999 |
- Broke ground on new 70,000 square foot headquarters
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| 2000 |
- Introduction of the 0.125 inch centers, 0.250 inch stroke (125-25 Series) test probes and sockets
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| 2001 |
- Introduction of our X75 and X50, X Probe Socketless Series
- Move into new facility located at 110 Towle Farm Road, Hampton, New Hampshire
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| 2002 |
- Introduction of our X39-25 X Socketless Series probes and termination pins
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| 2003 |
- Introduction of our Micro IC Probe Series for BGA and integrated circuit testing
- U.S. Patent #6,570,399 is granted for X Probe Socketless Technology
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| 2004 |
- Introduction of lead-free (Pb-free) sockets
- U.S. Patent #6,767,260 is granted for integraMate hyperboloid contact technology
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| 2005 |
- U.S. Patent #6,876,530 is granted for X Probe Socketless Technology jack termination
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| 2006 |
- Introduction of High Preload “E” Spring in our 0.100", 0.075" and 0.050" probes
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| 2007 |
- Introduction of integraMate 0.6mm hyperboloid contacts (ICO6 Series) and circular connectors (DO2 Series)
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| 2008 |
- Introduction of integraMate 1.5mm hyperboloid contacts (ICOA5 Series)
- Introduction of integraMate 0.45mm, 0.5mm and 0.6mm hyperboloid contacts (ICS Series)
- Introduction of new Steel Razor Tip Styles, solving today's test challenges.
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| 2009 |
- Introduction of 0.050 inch center, 0.400 stroke (050-T40 & X39-40 Series)
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| 2011 |
- Introduction of X31-25 X Probe Socketless Series & terminations
- Introduction of new wire grip terminations for 50mil sockets and termination pins.
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| 2012 |
- Introduction of conventional 39mil double-ended sockets for wireless testing.
- Introduction of 050-R40 Series long strong probes.
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| 2013 |
- Introduction of conventional 156-25 Series, 156mil probes and sockets
- Introduction of X31 double ended wireless termination pins
- Introduction of 039-40 and X31-40 long stroke probes
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| 2014 |
- Introduction of conventional 187-25 Series, 187mil probes and sockets
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| 2016 |
- Introduction of 0.35mm double ended probe
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| 2017 |
- Introduction of silver plated high current probes, for 125-25, 156-25 & 187-25 Series
- Launched new www.qatech.com website
- Introduction of instructional videos
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| 2018 |
- Introduction of Low Profile X Probes
- Launched new Spanish version of www.qatech.com website
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| 2019 |
- Launched new Chinese version of www.qatech.com website
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| 2020 |
- Introduction of 0.100 inch centers, 0.500 extended stroke (100-50 series)
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