As the physical size of printed circuit boards continues to shrink faster than ever, smaller targets on closer centers have a direct correlation to the rapidly growing demand of smaller probes used in test fixtures today.
X Probe® Socketless Technology overcomes the shortcomings of using conventional probes on fine pitched targets. The X Probe socketless design utilizes a larger more robust probe and allows it to be mounted on closer centers compared to a conventional probe and socket system.
The X Probe Socketless Series comprises two parts: a test probe and a termination pin. The probe is designed around our patented rolled probe tube design with a modified interconnect receptacle on the bottom. This interconnect receptacle increases the tube length while all other aspects of the probe are the same. The interconnect receptacle receives the precision interconnect pin located at the top of the termination pin.
The termination pin is unique in that it performs all the functions of a typical socket while staying within the diameter of the probe tube. The termination pin is the heart of the assembly. It retains the probe at the proper set height by utilizing two retention beads while providing a reliable electrical connection between the probe and the test fixture’s wiring.
